Subjects
(213)
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Pierre-Philippe Matthieu, Editor ; Christoph Aubrecht, Editor | New York, NY : Springer | ISSI scientific report series | 2018Pierre-Philippe Matthieu, Editor ; Christoph Aubrecht, Editor | New York, NY : Springer | ISSI scientific report series | 2018
Pinliang Dong, Author ; Qi Chen, Author | [S.l.] : Milton : Taylor and Francis | Remote sensing applications series | 2018
Joseph N. Pelton, Editor ; Scott Madry, Editor ; Sergio Camacho-Lara, Editor | New York, NY : Springer | 2017Joseph N. Pelton, Editor ; Scott Madry, Editor ; Sergio Camacho-Lara, Editor | New York, NY : Springer | 2017
Kass Green, Author ; Russell G. Congalton, Author ; Mark Tukman, Author | [S.l.] : ESRI Press | 2017
Siamak Khorram, Author ; Cynthia F. van der Wiele, Author ; Frank H. Koch, Author ; Stacy A.C. Nelson, Author ; Matthew D. Potts, Author | New York, NY : Springer | 2016
Thomas M. Lillesand, Author ; R. W. Kiefer, Author ; Jonathan W. Chipman, Author | Hoboken, N.J. : John Wiley & Sons | 2015
Joseph N. Pelton, Editor ; Scott Madry, Editor ; Sergio Camacho-Lara, Editor | New York, NY : Springer | 2013Joseph N. Pelton, Editor ; Scott Madry, Editor ; Sergio Camacho-Lara, Editor | New York, NY : Springer | 2013
Valery Alexandrovich Menshikov, Author ; Anatoly N. Perminov, Author ; Yuri M. Urlichich, Author | New York, NY : Springer | 2011
Jacqueline Le Moigne, Editor ; Nathan S. Netanyahu, Editor ; Roger D. Eastman, Editor | Cambridge : Cambridge University Press | 2011
